Structural and optical properties of ZnO thin films prepared by sol-gel method with different thickness

Applied Surface Science

Volumn 257, Issue 9, 2011, Pages 4031-4037

  Xu, Linhua ^a   Li, Xiangyin ^b   Chen, Yulin ^a   Xu, Fei ^a  

^a NANJING UNIVERSITY OF INFORMATION SCIENCE AND TECHNOLOGY   (China)

^b NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Film thickness; Growth mode; Optical properties; Sol gel method; ZnO thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; FILM GROWTH; FILM PREPARATION; FILM THICKNESS; II-VI SEMICONDUCTORS; METALLIC FILMS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SOL-GEL PROCESS; SOL-GELS; SUBSTRATES; THIN FILMS; ZINC OXIDE; ZINC SULFIDE;

CRYSTALLINE QUALITY; GROWTH MODES; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL DISORDERS; ULTRAVIOLET EMISSION; UV-VISIBLE SPECTROPHOTOMETER; X RAY DIFFRACTOMETERS; ZNO THIN FILM;

OPTICAL FILMS;

EID: 78951494415     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.11.170     Document Type: Article

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