Characterisation, analysis and optical properties of nanostructure ZnO using the sol-gel method

Micro and Nano Letters

Volumn 7, Issue 2, 2012, Pages 163-167

  Kashif, M ^a   Al Douri, Y ^a   Hashim, U ^a   Ali, M E ^a   Ali, S M U ^b,c   Willander, M ^b  

^a UNIVERSITY MALAYSIA PERLIS   (Malaysia)

^b LINKÖPING UNIVERSITY   (Sweden)

^c NED UNIVERSITY OF ENGINEERING AND TECHNOLOGY   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENT PRECURSORS; HYPOXIC ENVIRONMENTS; NANOFLAKES; OPTICAL DIELECTRIC CONSTANT; OPTICAL PROPERTIES OF NANOSTRUCTURES; PRECURSOR CONCENTRATION; RED SHIFT; RED-SHIFTED; SILICON SUBSTRATES; STRUCTURAL CHANGE; STRUCTURAL DEFECT; ZNO; ZNO NANOCRYSTAL;

NANORODS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS;

ZINC OXIDE;

ALUMINUM; NANOCRYSTAL; NANOMATERIAL; NANOROD; SILICON; ZINC OXIDE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; CONCENTRATION (PARAMETERS); CRYSTALLIZATION; DENSITY; DIELECTRIC CONSTANT; OPTICS; PHYSICAL CHEMISTRY; PRECURSOR; RAMAN SPECTROMETRY; REFRACTION INDEX; SCANNING ELECTRON MICROSCOPY; SOL GEL ANALYSIS; SURFACE PROPERTY; X RAY DIFFRACTION;

EID: 84858115185     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2011.0681     Document Type: Article

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