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Volumn 142, Issue , 2015, Pages 116-122

Carrier-diffusion corrected J0-analysis of charge carrier lifetime measurements for increased consistency

Author keywords

Band gap narrowing; Dark saturation current; Lifetime; QSSPC; Silicon

Indexed keywords

CHARGE CARRIERS; CRYSTALLINE MATERIALS; DIFFUSION; ENERGY GAP; QUANTUM WELL LASERS; SILICON;

EID: 84940453026     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2015.06.043     Document Type: Article
Times cited : (106)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.