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Volumn 8, Issue , 2011, Pages 94-99
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Modelling silicon characterisation
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Author keywords
Characterisation; Modelling
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Indexed keywords
CHARACTERIZATION;
CRYSTALLINE MATERIALS;
ELECTRONIC PROPERTIES;
MODELS;
SILICON;
CARRIER RECOMBINATION;
CHARACTERISATION;
CHARACTERIZATION TECHNIQUES;
COMPUTER MODELING;
CRYSTALLINE SILICONS;
DEVICE PERFORMANCE;
SILICON CHARACTERISATION;
SILICON MATERIALS;
SILICON WAFERS;
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EID: 80052098144
PISSN: 18766102
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1016/j.egypro.2011.06.108 Document Type: Conference Paper |
Times cited : (26)
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References (8)
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