Anomaly detection of light-emitting diodes using the similarity-based metric test

IEEE Transactions on Industrial Informatics

Volumn 10, Issue 3, 2014, Pages 1852-1863

  Chang, Moon Hwan ^a,b   Chen, Chaochao ^a,c   Das, Diganta ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Samsung Display Co   (South Korea)

^c DEI Group ^*  (United States)

Author keywords

Anomaly detection; Clustering; Light emitting diode (LED); Prognostics and health management (PHM); Prognostics based qualification; Similarity based metric test

Indexed keywords

DIODES; PRINCIPAL COMPONENT ANALYSIS; PRODUCT DEVELOPMENT; RADIOACTIVE WASTE STORAGE; STATISTICAL TESTS; SYSTEMS ENGINEERING; TESTING;

ANOMALY DETECTION; CLUSTERING; K NEAREST NEIGHBOR (KNN); PRODUCT DEVELOPMENT CYCLE; PROGNOSTICS AND HEALTH MANAGEMENTS; PROGNOSTICS-BASED QUALIFICATION; REMAINING USEFUL LIFE PREDICTIONS; SPECTRAL POWER DISTRIBUTION;

LIGHT EMITTING DIODES;

EID: 84938833017     PISSN: 15513203     EISSN: None     Source Type: Journal    
DOI: 10.1109/TII.2014.2332116     Document Type: Article

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