Challenges of microtome-based serial block-face scanning electron microscopy in neuroscience

Journal of Microscopy

Volumn 259, Issue 2, 2015, Pages 137-142

  Wanner, A A ^a   Kirschmann, M A ^a   Genoud, C ^a  

^a FRIEDRICH MIESCHER INSTITUTE FOR BIOMEDICAL RESEARCH   (Switzerland)

Author keywords

Microtome; Registration; SBFSEM; Segmentation; Serial block face scanning electron microscopy (SBEM); Three dimensional reconstruction; Tiling

Indexed keywords

BRAIN; BRAIN MAPPING; ELECTRIC NETWORK ANALYSIS; ELECTRONS; IMAGE ANALYSIS; ION BEAMS; NEURONS;

CIRCUIT RECONSTRUCTION; FIELD OF VIEWS; MICROTOME; NEURONAL CIRCUITS; REGISTRATION; SBFSEM; SEGMENTATION; SERIAL BLOCK-FACE SCANNING ELECTRON MICROSCOPY; THREE-DIMENSIONAL RECONSTRUCTION; TILING;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; BRAIN FUNCTION; BRAIN MAPPING; CONNECTOME; HUMAN; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; MICROTOME; NERVE CELL; NEUROIMAGING; NEUROSCIENCE; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SERIAL BLOCK FACE SCANNING ELECTRON MICROSCOPY; SYNAPSE; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE; ANIMAL; BRAIN; DEVICES; HISTOLOGY; MICROTOMY; NERVE TRACT; PROCEDURES;

ANIMALS; BRAIN; CONNECTOME; HISTOCYTOLOGICAL PREPARATION TECHNIQUES; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON, SCANNING; MICROTOMY; NEURAL PATHWAYS; NEURONS; NEUROSCIENCES; SYNAPSES;

EID: 84937250771     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12244     Document Type: Article

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