Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beam

Journal of Microscopy

Volumn 252, Issue 3, 2013, Pages 258-262

  Boergens, K M ^a   Denk, W ^a  

^a MAX PLANCK INSTITUTE FOR MEDICAL RESEARCH   (Germany)

Author keywords

Beam position control; FIB SBEM; FIB SEM; Focused ion beam; Slice thickness

Indexed keywords

FOCUSED ION BEAMS; IONS;

BEAM APPROACH; BEAM CUTTING; BEAM POSITION CONTROL; BEAM POSITIONS; FIB SEM; FIB-SBEM; FOCUSED IONS BEAMS; RELATIVE POSITIONS; SLICE THICKNESS; TRANSMITTED BEAMS;

POSITION CONTROL;

ACCURACY; ARTICLE; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; PRIORITY JOURNAL; RADIATION BEAM; SERIAL BLOCK FACE ELECTRON MICROSCOPY; TEMPERATURE;

EID: 84887618280     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12086     Document Type: Article

References (9)

1. Briggman, K.L. & Bock, D.D. (2012) Volume electron microscopy for neuronal circuit reconstruction. Curr. Opin. Neurobiol. 22, 154-161.
2. Briggman, K.L. & Denk, W. (2006) Towards neural circuit reconstruction with volume electron microscopy techniques. Curr. Opin. Neurobiol. 16, 562-570.
3. Briggman, K.L., Helmstaedter, M. & Denk, W. (2011) Wiring specificity in the direction-selectivity circuit of the retina. Nature. 471, 183-U167.
4. Denk, W., Briggman, K.L. & Helmstaedter, M. (2012) Structural neurobiology: missing link to a mechanistic understanding of neural computation. Nature reviews. Neuroscience. 13, 351-358.
5. Denk, W. & Horstmann, H. (2004) Serial block-face scanning electron microscopy to reconstruct three-dimensional tissue nanostructure. PLoS Biol. 2, e329.
6. Groeber, M.A., Haley, B.K., Uchic, M.D., Dimiduk, D.M. & Ghosh, S. (2006) 3D reconstruction and characterization of polycrystalline microstructures using a FIB-SEM system. Mater. Charact. 57, 259-273.
7. Heymann, J.A., Hayles, M., Gestmann, I., Giannuzzi, L.A., Lich, B. & Subramaniam, S. (2006) Site-specific 3D imaging of cells and tissues with a dual beam microscope. J. Struct. Biol. 155, 63-73.
8. Knott, G., Marchman, H., Wall, D. & Lich, B. (2008) Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling. J. Neurosci. 28, 2959-2964.
9. Lichtman, J.W. & Denk, W. (2011) The big and the small: challenges of imaging the brain's circuits. Science. 334, 618-623.