Changes of the Molecular Structure in Organic Thin Film Transistors during Operation

Journal of Physical Chemistry C

Volumn 119, Issue 28, 2015, Pages 15912-15918

  Liscio, Fabiola ^a   Ferlauto, Laura ^a   Matta, Micaela ^b   Pfattner, Raphael ^c   Murgia, Mauro ^d   Rovira, Concepció ^c   Mas Torrent, Marta ^c   Zerbetto, Francesco ^b   Milita, Silvia ^a   Biscarini, Fabio ^e  

^a CNR   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^d CNR   (Italy)

^e UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; FIELD EFFECT TRANSISTORS; GRAIN BOUNDARIES; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE; TRANSISTORS; X RAY DIFFRACTION;

DIFFERENT LENGTH SCALE; ELECTRICAL RESPONSE; ORGANIC THIN FILM TRANSISTORS; PENTACENE THIN FILM TRANSISTORS; REAL-TIME X-RAY DIFFRACTION; SEMICONDUCTOR MICROSTRUCTURES; STRUCTURAL MODIFICATIONS; THEORETICAL CALCULATIONS;

THIN FILMS;

EID: 84937146932     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/acs.jpcc.5b03901     Document Type: Article

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