Growth of Thin, Anisotropic, π-Conjugated Molecular Films by Stepwise "click" Assembly of Molecular Building Blocks: Characterizing Reaction Yield, Surface Coverage, and Film Thickness versus Addition Step Number

Journal of the American Chemical Society

Volumn 137, Issue 27, 2015, Pages 8819-8828

  Demissie, Abel T ^a   Haugstad, Greg ^b   Frisbie, C Daniel ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; CARBON; CYCLIC VOLTAMMETRY; FILM GROWTH; GOLD; INFRARED SPECTROSCOPY; MONOMERS; NUCLEAR REACTIONS; ORGANIC POLYMERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SELF ASSEMBLED MONOLAYERS; SELF ASSEMBLY; SPECTROSCOPIC ELLIPSOMETRY; SURFACE REACTIONS;

4-AMINOTHIOPHENOL; MOLECULAR BUILDING BLOCKS; MOLECULAR SURFACES; MONOMER ADDITION; NUCLEAR REACTION ANALYSIS; REFLECTION ABSORPTION INFRARED SPECTROSCOPY; RUTHERFORD BACK-SCATTERING SPECTROMETRY; SURFACE COVERAGES;

X RAY PHOTOELECTRON SPECTROSCOPY;

ALDEHYDE; CARBON; GOLD; HALOGEN; IMINE; MONOMER; NANOFILM; NANOWIRE; OLIGOPHENYLENEIMINE; SCHIFF BASE; SELF ASSEMBLED MONOLAYER; THIOPHENOL DERIVATIVE; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; CHEMICAL REACTION; CHEMICAL STRUCTURE; CLICK CHEMISTRY; CONJUGATION; CYCLIC POTENTIOMETRY; ELLIPSOMETRY; INFRARED SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROMETRY; SPECTROMETRY; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84937118041     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/jacs.5b04512     Document Type: Article

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