Quantitative AES. VIII: Analysis of Auger electron intensities from elemental data in a digital auger database

Surface and Interface Analysis

Volumn 26, Issue 12, 1998, Pages 908-929

  Seah, M P ^a   Gilmore, I S ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Auger electron spectroscopy; Cross sections; Data base; Quantification

Indexed keywords

BACKSCATTERING; CORRELATION METHODS; DATABASE SYSTEMS; ELECTRON EMISSION; IONIZATION; MATHEMATICAL MODELS; MATRIX ALGEBRA; QUANTUM THEORY; SENSITIVITY ANALYSIS;

DIGITAL AUGER DATABASE;

AUGER ELECTRON SPECTROSCOPY;

EID: 0032206249     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199811)26:12<908::aid-sia438>3.0.co;2-h     Document Type: Article

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