Leakage Power Reduction by Dual-Vth Designs under Probabilistic Analysis of Vth Variation

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn 2004-January, Issue January, 2004, Pages 2-7

  Liu, Michael ^a   Wang, Wei Shen ^a   Orshansky, Michael ^a  

^a The University of Texas at Austin   (United States)

Author keywords

Power minimization; variability; yield

Indexed keywords

DESIGN; OPTIMAL SYSTEMS; POWER ELECTRONICS;

LEAKAGE POWER REDUCTION; POWER MINIMIZATION; PROBABILISTIC ANALYSIS; PROBABILISTIC ANALYTICAL MODELS; PROCESS VARIABILITY; STATISTICAL MODELING; VARIABILITY; YIELD;

LOW POWER ELECTRONICS;

EID: 84932168626     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LPE.2004.240694     Document Type: Conference Paper

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