Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

Journal of Physical Chemistry C

Volumn 119, Issue 23, 2015, Pages 12910-12915

  Lin, Chi Yuan ^a,b   Cheng, Cheng En ^a,b   Wang, Shuai ^b   Shiu, Hung Wei ^c   Chang, Lo Yueh ^c,d   Chen, Chia Hao ^c   Lin, Tsung Wu ^b   Chang, Chen Shiung ^a   Chien, Forest Shih Sen ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b TUNGHAI UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL GROUPS; GRAPHENE; OXIDE FILMS; PHOTOELECTRONS; PHOTONS; REDUCTION; SECONDARY EMISSION; SYNCHROTRON RADIATION; SYNCHROTRONS;

EXPONENTIAL DECAYS; GRAPHENE OXIDES; LOW ENERGY SECONDARY ELECTRONS; OXYGEN-CONTAINING FUNCTIONAL GROUPS; REDUCTION RATE; SECONDARY ELECTRONS; SITU X-RAY PHOTOELECTRON SPECTROSCOPY; TIME-RESOLVED PHOTOELECTRON SPECTROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84931275256     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp512055g     Document Type: Article

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