A Bayesian Method for Planning Accelerated Life Testing

IEEE Transactions on Reliability

Volumn 64, Issue 4, 2015, Pages 1383-1392

  Xu, Ancha ^a,b   Tang, Yincai ^c  

^a WENZHOU UNIVERSITY   (China)

^b NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

^c EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Accelerated life testing; censored data; Kullback Leibler divergence; reference prior; Weibull distribution

Indexed keywords

BAYESIAN NETWORKS; INTELLIGENT SYSTEMS; NUMERICAL METHODS; STATISTICAL TESTS; TESTING; WEIBULL DISTRIBUTION; ELECTRON EMISSION; MONTE CARLO METHODS;

ACCELERATED LIFE TESTING; AMOUNT OF INFORMATION; BAYESIAN CRITERION; BAYESIAN METHODS; KULLBACK LEIBLER DIVERGENCE; OPTIMALITY CRITERIA; PRIOR DISTRIBUTION; TYPE-I CENSORING; CENSORED DATA; REFERENCE PRIOR;

MONTE CARLO METHODS; WEIBULL DISTRIBUTION;

EID: 84930438200     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2015.2436374     Document Type: Article

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