Correction of the tip convolution effects in the imaging of nanostructures studied through scanning force microscopy

Nanotechnology

Volumn 25, Issue 39, 2014, Pages

  Canet Ferrer, Josep ^a   Coronado, Eugenio ^a   Forment Aliaga, Alicia ^a   Pinilla Cienfuegos, Elena ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

Author keywords

atomic force microscopy; image reconstruction; lateral resolution; scanning artefact; tip convolution effect; tip deconvolution

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; IMAGE RECONSTRUCTION; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS;

ELONGATED OBJECTS; FLAT SUBSTRATES; GEOMETRICAL CONSIDERATIONS; LATERAL RESOLUTION; NANOMETRICS; OBJECT SHAPE; TIP CONVOLUTION; TIP RADIUS;

CONVOLUTION;

EID: 84927138953     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/39/395703     Document Type: Article

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