Size determination of nanoparticles based on tapping-mode atomic force Microscopy Measurements

Journal of Scanning Probe Microscopy

Volumn 3, Issue 1-2, 2008, Pages 1-8

  Mott, Derrick ^a   Cotts, Benjamin ^a   Lim, Mm S ^a   Luo, Jin ^a   Park, Hye Young ^a   Njoki, Peter N ^a   Schadt, Mark J ^a   Zhong, Chuan Jian ^a  

^a BINGHAMTON UNIVERSITY   (United States)

Author keywords

Nanoparticles; TM AFM Measurements

Indexed keywords

AFM; GOLD NANOPARTICLES; IN-SITU; LATERAL SIZES; LIMITED INFORMATION; MONO-DISPERSED; NANO-SCALE MATERIALS; QUANTITATIVE CORRELATION; RELATIVE RADIUS; SIZE RANGES; SOLID SUBSTRATES; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TEM; TM-AFM MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; ATOMS; NANOPARTICLES; SURFACE PROPERTIES; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

PARTICLE SIZE;

EID: 47249096413     PISSN: 15577937     EISSN: None     Source Type: Journal    
DOI: 10.1166/jspm.2008.001     Document Type: Article

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