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Volumn 48, Issue , 2015, Pages 528-532

High-resolution characterization of the forbidden Si 200 and Si 222 reflections

Author keywords

forbidden reflections; multiple diffraction; silicon; Umweganregung; X ray diffraction

Indexed keywords

X RAY DIFFRACTION;

EID: 84926315457     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576715004732     Document Type: Article
Times cited : (230)

References (14)
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.