Microstructure of (104)-oriented Bi 3.25la 0.75Ti 3O 12 and Bi 3.54Nd 0.46Ti 3O 12 ferroelectric thin films on multiply twinned SrRuO 3/Pt(111) electrodes on YSZ(100)-buffered Si(100)

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 12, 2005, Pages 2287-2298

  Hesse, Dietrich ^a   Lee, Sung Kyun ^a   Gösele, Ulrich ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PLATINUM ELECTRODES; SILICON-BASED TECHNOLOGIES; SUBSTRATE SURFACE;

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; COERCIVE FORCE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRODES; FATIGUE OF MATERIALS; FILM GROWTH; MICROSTRUCTURE; MORPHOLOGY; PULSED LASER DEPOSITION; SPUTTERING; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

FERROELECTRIC THIN FILMS;

EID: 26444607905     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200521176     Document Type: Article

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