XFEL diffraction: Developing processing methods to optimize data quality

Journal of Synchrotron Radiation

Volumn 22, Issue 2, 2015, Pages 239-248

  Sauter, Nicholas K ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

mosaicity Includes papers presented at the 8th International Workshop on X ray Radiation Damage to Biological Crystalline Samples; partiality; postrefinement; serial femtosecond crystallography; X ray free electron laser

Indexed keywords

CRYSTALS; DATA HANDLING; ELECTRONS; FREE ELECTRON LASERS; RADIATION DAMAGE; SYNCHROTRON RADIATION; X RAYS;

INTERNATIONAL WORKSHOPS; PARTIALITY; POST-REFINEMENT; SERIAL FEMTOSECOND CRYSTALLOGRAPHIES; X-RAY FREE ELECTRON LASERS;

X RAY CRYSTALLOGRAPHY;

HUMAN; LASER; MEASUREMENT ACCURACY; MOLECULAR MODEL; PROCEDURES; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

CRYSTALLOGRAPHY, X-RAY; DATA ACCURACY; HUMANS; LASERS; MODELS, MOLECULAR; X-RAY DIFFRACTION;

EID: 84924243435     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514028203     Document Type: Conference Paper

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