Global indicators of X-ray data quality

Journal of Applied Crystallography

Volumn 34, Issue 2, 2001, Pages 130-135

  Weiss, Manfred S ^a  

^a FRITZ LIPMANN INSTITUTE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CALCULATION; DATA ANALYSIS; MEASUREMENT; QUALITY CONTROL; X RAY DIFFRACTION;

EID: 0035066836     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800018227     Document Type: Article

References (10)

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4. Dauter, Z., Dauter, M., de La Fortelle, E., Bricogne, G. & Sheldrick, G. M. (1999). J. Mol. Biol. 289, 83-92.
5. Vaguine, A. A., Richelle, J. & Wodak, S. J. (1999). Acta Cryst. D55, 191-205.
6. Weeks, C. M. & Miller, R. (1999). J. Appl. Cryst. 32, 120-124.
7. Weiss, M. S. & Hilgenfeld, R. (1997). J. Appl. Cryst. 30, 203-205.
8. Weiss, M. S., Metzner, H. J. & Hilgenfeld, R. (1998). FEBS Lett. 423, 291-296.
9. Weiss, M. S., Palm, G. J. & Hilgenfeld, R. (2000). Acta Cryst. D56, 952-958.
10. Wilson, A. J. C. (1949). Acta Cryst. 2, 318-321.