Femtosecond protein nanocrystallography- Data analysis methods

Optics Express

Volumn 18, Issue 6, 2010, Pages 5713-5723

  Kirian, Richard A ^a   Wang, Xiaoyu ^a   Weierstall, Uwe ^a   Schmidt, Kevin E ^a   Spence, John C H ^a   Hunter, Mark ^a   Fromme, Petra ^a   White, Thomas ^b   Chapman, Henry N ^b   Holton, James ^c,d  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF HAMBURG   (Germany)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ALLOYS; ELECTROMAGNETIC PULSE; HOLOGRAPHIC INTERFEROMETRY; METALLIC GLASS; PROTEINS; PULSED LASER APPLICATIONS; RADIATION DAMAGE; X RAY DIFFRACTION;

DATA ANALYSIS METHODS; FEMTOSECOND PULSE; FEMTOSECONDS; MONTE CARLO INTEGRATION; NANOCRYSTALLOGRAPHY; NUMBER OF SHOTS; PHOTOSYSTEM I; RANDOM ORIENTATIONS; SHORT PULSE; SINGLE-SHOT; STRUCTURE FACTORS; SUBMICRON;

NANOCRYSTALS;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; METHODOLOGY; PHOTOSYSTEM I; ULTRASTRUCTURE; X RAY DIFFRACTION;

ALGORITHMS; PATTERN RECOGNITION, AUTOMATED; PHOTOSYSTEM I PROTEIN COMPLEX; X-RAY DIFFRACTION;

EID: 77949588458     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.005713     Document Type: Article

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