A single-shot transmissive spectrometer for hard x-ray free electron lasers

Applied Physics Letters

Volumn 101, Issue 3, 2012, Pages

  Zhu, Diling ^a   Cammarata, Marco ^a,b   Feldkamp, Jan M ^a   Fritz, David M ^a   Hastings, Jerome B ^a   Lee, Sooheyong ^a,c   Lemke, Henrik T ^a   Robert, Aymeric ^a   Turner, James L ^a   Feng, Yiping ^a  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b UNIVERSITÉ DE RENNES 1   (France)

^c Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HARD X RAY; HIGH RESOLUTION; HIGH TRANSMISSION; INCIDENT FLUX; LINAC COHERENT LIGHT SOURCE; POTENTIAL APPLICATIONS; SELF-AMPLIFIED SPONTANEOUS EMISSION; SI (1 1 1); SINGLE-SHOT; SPECTRAL MEASUREMENT; SPECTRAL RANGE; X-RAY FREE ELECTRON LASERS;

FREE ELECTRON LASERS; GEOMETRY; LIGHT SOURCES; SILICON; SILICON WAFERS; SPECTROMETERS; SPECTROMETRY;

X RAYS;

EID: 84864255895     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4736725     Document Type: Article

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