Automated diffraction image analysis and spot searching for high-throughput crystal screening

Journal of Applied Crystallography

Volumn 39, Issue 1, 2006, Pages 112-119

  Zhang, Zepu ^a   Sauter, Nicholas K ^b   Van Den Bedem, Henry ^c   Snell, Gyorgy ^d   Deacon, Ashley M ^c  

^a UNIVERSITY OF CHICAGO   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d Takeda San Diego Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645160257     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889805040677     Document Type: Article

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