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Volumn 6, Issue , 2015, Pages

Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects

Author keywords

[No Author keywords available]

Indexed keywords

CATION; CERIUM OXIDE; OXYGEN;

EID: 84924022270     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms7294     Document Type: Article
Times cited : (163)

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