Microstructure characterization of a cobalt-oxide-doped cerium-gadolinium-oxide by analytical and high-resolution TEM

Acta Materialia

Volumn 55, Issue 8, 2007, Pages 2907-2917

  Zhang, Zaoli ^a   Sigle, Wilfried ^a   Rühle, Manfred ^a   Jud, Eva ^b   Gauckler, Ludwig J ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b ETH ZURICH   (Switzerland)

Author keywords

Ceramics; EFTEM; Grain boundary segregation; HRTEM; Sintering

Indexed keywords

COBALT COMPOUNDS; DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PRECIPITATION (CHEMICAL); SINTERING;

GRAIN BOUNDARY CONCENTRATION; GRAIN BOUNDARY SEGREGATION; O-K ABSORPTION EDGES;

CERIUM COMPOUNDS;

EID: 34047168269     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.12.039     Document Type: Article

References (34)

1. Steele B.C.H. Solid State Ionics 129 (2000) 95
2. Huijsmans J.P.P. Curr Opin Solid State Mater Sci 5 (2001) 317
3. Yamamoto O. Electrochim Acta 45 (2000) 2423
4. Kleinlogel C., and Gauckler L.J. Solid State Ionics 135 (2000) 567
5. Fagg D.P., Kharton V.V., and Frade J.R. J Electroceram 9 (2002) 199
6. Lewis G.S., Atkinson A., Steele B.C.H., and Drennan J. Solid State Ionics 152 (2002) 567
7. Fagg D.P., Abrantes J.C.C., Perez-Coll D., Nunez P., Kharton V.V., and Frade J.R. Electrochim Acta 48 (2003) 1023
8. Jud E., and Gauckler L.J. J Electroceram 14 (2005) 247
9. Jud E., and Gauckler L.J. J Electroceram 15 (2005) 159
10. 2-x/2. PhD thesis, Swiss Federal Institute of Technology, Zurich, 2005.
11. Bruley J., Tanaka I., Kleebe H.-J., and Rühle M. Anal Chim Acta 297 (1994) 97
12. Gu H., Cannon R.M., and Rühle M. J Mater Res 13 (1998) 376
13. Strecker A., Salzberger U., and Mayer J. Prakt Metallogr 30 (1993) 482
14. Williams D.B. Practical analytical electron microscopy in materials science (1984), Philips Electron Optics Publishing Group, Mahwah (NJ) p. 71
15. Egerton RF. Electron energy loss spectroscopy in the electron microscope, 2nd ed. New York: Plenum Press.
16. Ikeda J.A.S., Chiang Y.-M., Garratt-Reed A.J., and Vander Sande J.B. J Am Ceram Soc 76 (1993) 2447
17. Zhang Z.L., Sigle W., and Rühle M. Phys Rev B 66 (2002) 094108
18. Jud E., Huwiler C.B., and Gauckler L.J. J Amer Ceram Soc 88 (2005) 3013
19. Zhang ZL. Ultramicroscopy, in press.
20. Mocala K., Navrotsky A., and Sherman D.M. Phys Chem Miner 19 (1992) 88
21. Chen M., Hallstedt B., Grundy A.N., and Gauckler L.J. J Am Ceram Soc 86 (2003) 1567
22. Sirman J.D., Waller D., and Kilner J.A. In: Worrell W.L. (Ed). Ionic and mixed conducting ceramics III PV 97-24 (1998), The Electrochemical Society, Pennington 1159
23. Ranløv J., Poulsen F.W., and Mogensen M. Solid State Ionics 61 (1993) 277
24. Hrovat M., Holc J., and Bernik S. J Mater Res 14 (1999) 1692
25. Kikuchi R., and Cahn J.W. Phys Rev B 21 (1980) 1893
26. Subramaniam A., Koch C.T., Cannon R.M., and Rühle M. Mater Sci Eng A 422 (2006) 3
27. Bishop C.M., Tang M., Cannon R.M., and Carter W.C. Mater Sci Eng A 422 (2006) 102
28. Jud E., Huwiler C.B., and Gauckler L.J. J Ceram Soc Jpn 114 (2006) 963
29. Luo J., Wang H.F., and Chiang Y.M. J Amer Ceram Soc 82 (1999) 916
30. Hayden H.W., and Brophy J.H. J Electrochem Soc 110 (1963) 805
31. Luo J., Gupta V.K., Yoon D.H., and Meyer III H.M. Appl Phys Lett 87 (2005) 231902
32. Sankararaman M., and Perry D. J Mater Sci 27 (1992) 2731
33. Fortner J.A., Buck E.C., Ellison A.J.G., and Bates J.K. Ultramicroscopy 67 (1997) 77
34. Lei Y.Y., Ito Y., and Browning N.D. J Am Ceram Soc 85 (2002) 2359