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Volumn 98, Issue 15, 2011, Pages

Atomic structure and strain field of threading dislocations in CeO 2 thin films on yttria-stabilized ZrO2

(7) Hojo, Hajime a Tochigi, Eita a Mizoguchi, Teruyasu b Ohta, Hiromichi c,d Shibata, Naoya a,d Feng, Bin a Ikuhara, Yuichi a,e,f

a UNIVERSITY OF TOKYO (Japan)

b INSTITUTE OF INDUSTRIAL SCIENCE (Japan)

c NAGOYA UNIVERSITY (Japan)

d JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

e JAPAN FINE CERAMICS CENTER (Japan)

f TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; DISLOCATION MODELS; HIGH-RESOLUTION TEM; PEIERLS-NABARRO; PURE EDGE; SCANNING TEM; STRAIN FIELDS; TEM; THREADING DISLOCATION;

BURGERS VECTOR; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SUPERVISORY PERSONNEL; THIN FILMS; YTTRIUM ALLOYS; ZIRCONIUM ALLOYS;

EDGE DISLOCATIONS;

EID: 79954627469 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3575566 Document Type: Article

Times cited : (33)

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