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Volumn 135, Issue 50, 2013, Pages 18859-18865

Electronic and chemical properties of a surface-terminated screw dislocation in MgO

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPPING; ELECTRONIC CHARACTERISTICS; FIRST-PRINCIPLES INVESTIGATIONS; METAL OXIDE MATERIALS; MOLECULAR ADSORPTION; OXIDE SURFACE; SURFACE DISLOCATION; TOPOLOGICAL DEFECT;

EID: 84890771060     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja408342z     Document Type: Article
Times cited : (35)

References (63)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.