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Volumn 20, Issue 13, 2010, Pages 2071-2076

Low-temperature superionic conductivity in strained yttria-stabilized zirconia

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; IONIC CONDUCTIVITY; LOW TEMPERATURE EFFECTS; MAGNESIA; SINGLE CRYSTALS; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE; TITANIUM COMPOUNDS; YTTRIUM OXIDE; ZIRCONIA;

EID: 77955369385     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201000071     Document Type: Article
Times cited : (151)

References (38)
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    • This value is slightly higher than those reported in literature for bulkYSZ ∼1.1eV. This is likely due to the choice of atmosphere during measurements. Generally, the lowest activation energies are obtained in pure oxygen atmospheres
    • This value is slightly higher than those reported in literature for bulkYSZ (∼1.1eV). This is likely due to the choice of atmosphere during measurements. Generally, the lowest activation energies are obtained in pure oxygen atmospheres.
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    • A. R. West, in Basic Solid State Chemistry, 2nd ed. John Wiley & Sons, Chichester, England 1999, Ch. 7.
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    • (2009) Science , vol.324
    • Guo, X.1
  • 32
    • 77955411931 scopus 로고    scopus 로고
    • At a substrate temperature of 400°C, epitaxial YSZ films could only be grown on MgO 110 substrates, but with much less X-ray intensity of the observed YSZ 220 peaks not shown. Depositions made on STO 100 and MgO 111 at a substrate temperature of 400°C yielded polycrystalline YSZ films with a preferred <111> texture for all layer thicknesses
    • At a substrate temperature of 400°C, epitaxial YSZ films could only be grown on MgO (110) substrates, but with much less X-ray intensity of the observed YSZ 220 peaks (not shown). Depositions made on STO (100) and MgO (111) at a substrate temperature of 400°C yielded polycrystalline YSZ films with a preferred <111> texture for all layer thicknesses.
  • 33
    • 77955383131 scopus 로고    scopus 로고
    • Film thicknesses less than 100 nm were determined by X-ray reflectivity XRR measurements
    • Film thicknesses less than 100 nm were determined by X-ray reflectivity (XRR) measurements.
  • 35
    • 77955401512 scopus 로고    scopus 로고
    • Measurements on the sample deposited on MgO 111 were performed from 450 down to 200°C in steps of 25 °C
    • Measurements on the sample deposited on MgO (111) were performed from 450 down to 200°C in steps of 25 °C.
  • 36
    • 77955342955 scopus 로고    scopus 로고
    • ZSimpWin 3.21, EChem Software, Bruno Deum, Ann Arbor, Michigan, USA
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.