Accurate and precise measurement of oxygen isotopic fractions and diffusion profiles by selective attenuation of secondary ions (SASI)

Analytical Chemistry

Volumn 87, Issue 5, 2015, Pages 2907-2915

  Téllez, Helena ^a   Druce, John ^a   Hong, Jong Eun ^a,c   Ishihara, Tatsumi ^a   Kilner, John A ^a,b  

^a KYUSHU UNIVERSITY   (Japan)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DEPTH PROFILING; DIFFUSION; GRAIN BOUNDARIES; ION EXCHANGE; ISOTOPES; MASS SPECTROMETRY; MATERIALS PROPERTIES; ORGANIC POLYMERS; OXYGEN; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

ACCURACY AND PRECISION; ANALYTICAL PERFORMANCE; CONVENTIONAL APPROACH; ELECTROCERAMIC MATERIALS; ENERGY STORAGE AND CONVERSIONS; OXYGEN SURFACE EXCHANGE; OXYGEN TRANSPORT PROPERTIES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

IONS;

EID: 84923870558     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac504409x     Document Type: Article

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