Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 639-643

  Fielitz, P ^a   Borchardt, G ^a   Schmucker M ^b   Schneider, H ^b   Willich, P ^c  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b Deutsches Zentrum fur LR   (Germany)

^c Wilhelm Klauditz Institut (WKI)   (Germany)

Author keywords

Grain boundary diffusion; Mullite ceramics; Oxygen self diffusion

Indexed keywords

ALUMINUM COMPOUNDS; DIFFUSION; ENTHALPY; GRAIN BOUNDARIES; OXYGEN; SECONDARY ION MASS SPECTROMETRY; SURFACE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

DEPTH PROFILING;

CERAMIC MATERIALS;

EID: 12244275642     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00641-4     Document Type: Conference Paper

References (9)

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