A comparison between micro-Raman spectroscopy and SIMS of beveled surfaces for isotope depth profiling

Solid State Ionics

Volumn 253, Issue , 2013, Pages 185-188

  Stender, Dieter ^a   Heiroth, Sebastian ^a   Lippert, Thomas ^a   Wokaun, Alexander ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Isotope depth profiling; Oxygen ion conductor; Raman; SIMS

Indexed keywords

CONFOCAL RAMAN SPECTROSCOPY; DIFFUSION PROPERTIES; ISOTOPE EXCHANGE; MICRO RAMAN SPECTROSCOPY; OXYGEN-ION CONDUCTOR; RAMAN;

ION EXCHANGE; OXYGEN; SECONDARY ION MASS SPECTROMETRY;

ISOTOPES;

EID: 84886868272     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2013.09.053     Document Type: Article

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