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Volumn 34, Issue 12, 2009, Pages 907-914

Probing diffusion kinetics with secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ELEMENTS; DIFFUSION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); ISOTOPES; MASS SPECTROMETRY; SECONDARY EMISSION; SPECTROMETRY;

EID: 74049127905     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2009.212     Document Type: Article
Times cited : (76)

References (62)
  • 20
    • 0002218734 scopus 로고    scopus 로고
    • F.W. Poulsen, N. Bonanos, S. Linderoth, M. Mogensen, B. Zachau-Christiansen, Rise National Laboratory, Roskilde, Denmark
    • th Intnl. Rise Symp. On Mater. Sci., F.W. Poulsen, N. Bonanos, S. Linderoth, M. Mogensen, B. Zachau-Christiansen, Rise National Laboratory, Roskilde, Denmark (1996), p. 41.
    • (1996) th Intnl. Rise Symp. on Mater. Sci. , pp. 41
    • Kilner, J.A.1    De Souza, R.A.2
  • 52
    • 74049156515 scopus 로고    scopus 로고
    • PhD thesis, RWTH Aachen University, Aachen, North Rhine-Westphalia, Germany
    • O. Schulz, PhD thesis, RWTH Aachen University, Aachen, North Rhine-Westphalia, Germany (2003).
    • (2003)
    • Schulz, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.