SCOPUS 정보 검색 플랫폼

Journal of Analytical Atomic Spectrometry

Volumn 29, Issue 8, 2014, Pages 1361-1370

New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)

(8) Téllez, Helena a,b Aguadero, Ainara a,c Druce, John b Burriel, Mónica a Fearn, Sarah a Ishihara, Tatsumi b McPhail, David S a Kilner, John A a,b,c

a IMPERIAL COLLEGE LONDON (United Kingdom)

b KYUSHU UNIVERSITY (Japan)

c CIC ENERGIGUNE (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; HYDRAULIC STRUCTURES; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS; SURFACE CHEMISTRY;

ANALYTICAL APPROACH; CHEMICAL COMPOSITIONS; ELECTROCHEMICAL PERFORMANCE; EPITAXIAL THIN FILMS; LOW-ENERGY ION SCATTERING; SURFACE CHEMISTRY AND STRUCTURES; SURFACE SENSITIVITY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SURFACES;

EID: 84904170735 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c3ja50292a Document Type: Review

Times cited : (44)

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