Formation of ripples in atomically thin MoS2 and local strain engineering of electrostatic properties

Nanotechnology

Volumn 26, Issue 10, 2015, Pages

  Luo, Siwei ^a   Hao, Guolin ^a,b   Fan, Yinping ^a   Kou, Liangzhi ^c   He, Chaoyu ^a   Qi, Xiang ^a   Tang, Chao ^a   Li, Jin ^a   Huang, Kai ^a   Zhong, Jianxin ^a  

^a XIANGTAN UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

^c UNIVERSITY OF BREMEN   (Germany)

Author keywords

electrostatic properties; Kelvin probe force microscopy; local strain; MoS2 ripple nanostructures; surface potential

Indexed keywords

DEFORMATION; ELECTROSTATICS; NANOSTRUCTURES; PROBES; STRAIN; SURFACE POTENTIAL;

ELECTROSTATIC PROPERTIES; GROWTH MECHANISMS; KELVIN PROBE FORCE MICROSCOPY; LOCAL STRAINS; RIPPLE DEFORMATION; RIPPLE STRUCTURE; TWO-DIMENSIONAL MATERIALS; VAPOR PHASE DEPOSITION;

MOLYBDENUM COMPOUNDS;

EID: 84923830669     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/26/10/105705     Document Type: Article

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