Condition for perfect antireflection by optical resonance at material interface

Optica

Volumn 1, Issue 6, 2014, Pages 388-395

  Wang, Ken Xingze ^a   Yu, Zongfu ^a,b   Sandhu, Sunil ^a   Liu, Victor ^a,c   Fan, Shanhui ^a  

^a STANFORD UNIVERSITY   (United States)

^b Wisconsin Electric Machines and Power Electronics Consortium   (United States)

^c PALO ALTO RESEARCH CENTER   (United States)

Author keywords

Antireflection coatings; Photodetectors; Resonance; Solar energy

Indexed keywords

ANTIREFLECTION COATINGS; DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELD THEORY; NANOSTRUCTURED MATERIALS; OPTICAL WAVEGUIDES; PHOTODETECTORS; PHOTONS; QUANTUM OPTICS; RESONANCE; SOLAR CELLS; SOLAR ENERGY;

ABSORBER MATERIAL; COUPLED MODE THEORY; ELECTROMAGNETIC SIMULATION; FREE-SPACE WAVELENGTHS; INFRARED WAVELENGTHS; MATERIAL INTERFACES; SURFACE RECOMBINATIONS; THEORETICAL ARGUMENTS;

INTERFACES (MATERIALS);

EID: 84923821704     PISSN: 23342536     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPTICA.1.000388     Document Type: Article

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