Broadband omnidirectional antireflection coating based on subwavelength surface Mie resonators

Nature Communications

Volumn 3, Issue , 2012, Pages

  Spinelli, P ^a   Verschuuren, M A ^b   Polman, A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CONTROLLED STUDY; CROSS COUPLING REACTION; CRYSTAL STRUCTURE; ELECTRONICS; LIGHT; LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT SCATTERING; MIE RESONANCE; NEAR INFRARED SPECTROSCOPY; OPTICAL DENSITY; PARTICLE SIZE; QUANTUM YIELD; SEMICONDUCTOR; SPECTRAL SENSITIVITY; SURFACE PROPERTY; ULTRAVIOLET RADIATION;

EID: 84857704834     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms1691     Document Type: Article

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