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Nanoscale

Volumn 7, Issue 8, 2015, Pages 3651-3659

In situ imaging and control of layer-by-layer femtosecond laser thinning of graphene

(6) Li, D W a Zhou, Y S a Huang, X a Jiang, L b Silvain, J F c Lu, Y F a

a UNIVERSITY OF NEBRASKA LINCOLN (United States)

b BEIJING INSTITUTE OF TECHNOLOGY (China)

c INST CHIM MATIERE COND BORDEAUX (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; FOUR WAVE MIXING; ULTRAFAST LASERS;

FEMTOSECOND (FS) LASER; LARGE-SCALE THINNING; LINEAR RELATIONSHIPS; MECHANICAL EXFOLIATION; NUMBER OF LAYERS; RASTER SCANNING; REAL TIME MONITORING; THINNING PROCESS;

GRAPHENE;

EID: 84923206058 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c4nr07078j Document Type: Article

Times cited : (50)

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