-
1
-
-
3142541500
-
Heterodyne interferometric system with subnanometer accuracy for measurement of straightness
-
C. M. Wu, "Heterodyne interferometric system with subnanometer accuracy for measurement of straightness", Appl. Opt. 43(19), 3812-3816 (2004).
-
(2004)
Appl. Opt.
, vol.43
, Issue.19
, pp. 3812-3816
-
-
Wu, C.M.1
-
2
-
-
0032119598
-
High-resolution, high-speed, low data age uncertainty, heterodyne displacement measuring interferometer electronics
-
F. C. Demarest, "High-resolution, high-speed, low data age uncertainty, heterodyne displacement measuring interferometer electronics", Meas. Sci. Technol. 9(7), 1024-1030 (1998).
-
(1998)
Meas. Sci. Technol.
, vol.9
, Issue.7
, pp. 1024-1030
-
-
Demarest, F.C.1
-
3
-
-
0021918163
-
High-accuracy displacement interferometry in air
-
W. T. Estler, "High-accuracy displacement interferometry in air", Appl. Opt. 24(6), 808-815 (1985).
-
(1985)
Appl. Opt.
, vol.24
, Issue.6
, pp. 808-815
-
-
Estler, W.T.1
-
4
-
-
0003129241
-
High-accuracy translation-rotation encoder with two gratings in a Littrow mount
-
M. Nevièvre, E. Popov, B. Bojhkov, L. Tsonev, and S. Tonchev, "High-accuracy translation-rotation encoder with two gratings in a Littrow mount", Appl. Opt. 38(1), 67-76 (1999).
-
(1999)
Appl. Opt.
, vol.38
, Issue.1
, pp. 67-76
-
-
Nevièvre, M.1
Popov, E.2
Bojhkov, B.3
Tsonev, L.4
Tonchev, S.5
-
5
-
-
0006915066
-
Technology and applications of grating interferometers in high-precision measurement
-
A. Teimel, "Technology and applications of grating interferometers in high-precision measurement", Precis. Eng. 14(3), 147-154 (1992).
-
(1992)
Precis. Eng.
, vol.14
, Issue.3
, pp. 147-154
-
-
Teimel, A.1
-
6
-
-
79957734294
-
Measurement of small displacement based on surface plasmon resonance heterodyne interferometry
-
J. Y. Lin, K. H. Chen, and J. H. Chen, "Measurement of small displacement based on surface plasmon resonance heterodyne interferometry", Opt. Lasers Eng. 49(7), 811-815 (2011).
-
(2011)
Opt. Lasers Eng.
, vol.49
, Issue.7
, pp. 811-815
-
-
Lin, J.Y.1
Chen, K.H.2
Chen, J.H.3
-
7
-
-
36348993130
-
Small absolute distance measurement with nanometer resolution using geometrical optics principles and a SPR angular sensor
-
M. H. Chiu, B. Y. Shih, C. W. Lai, L. H. Shyu, and T. H. Wu, "Small absolute distance measurement with nanometer resolution using geometrical optics principles and a SPR angular sensor", Sens, Actuator A-Phys. 141(1), 217-223 (2008).
-
(2008)
Sens, Actuator A-Phys.
, vol.141
, Issue.1
, pp. 217-223
-
-
Chiu, M.H.1
Shih, B.Y.2
Lai, C.W.3
Shyu, L.H.4
Wu, T.H.5
-
8
-
-
67249110849
-
Small-displacement sensing system based on multiple total internal reflections in heterodyne interferometry
-
S. F. Wang, M. H. Chiu, W. W. Chen, F. H. Kao, and R. S. Chang, "Small-displacement sensing system based on multiple total internal reflections in heterodyne interferometry", Appl. Opt. 48(13), 2566-2573 (2009).
-
(2009)
Appl. Opt.
, vol.48
, Issue.13
, pp. 2566-2573
-
-
Wang, S.F.1
Chiu, M.H.2
Chen, W.W.3
Kao, F.H.4
Chang, R.S.5
-
9
-
-
75949109157
-
Measurement of small displacements with polarization properties of internal reflection and heterodyne interferometry
-
K. H. Chen, J. H. Chen, C. H. Cheng, and T. H. Yang, "Measurement of small displacements with polarization properties of internal reflection and heterodyne interferometry", Opt. Eng. 48(4), 043606 (2009).
-
(2009)
Opt. Eng.
, vol.48
, Issue.4
, pp. 043606
-
-
Chen, K.H.1
Chen, J.H.2
Cheng, C.H.3
Yang, T.H.4
-
10
-
-
84862823360
-
An alternative method for measuring small displacements with differential phase difference of dual-prism and heterodyne interferometry
-
K. H. Chen, H. S. Chiu, J. H. Chen, and Y. C. Chen, "An alternative method for measuring small displacements with differential phase difference of dual-prism and heterodyne interferometry", Measurement 45(6), 1510-1514 (2012).
-
(2012)
Measurement
, vol.45
, Issue.6
, pp. 1510-1514
-
-
Chen, K.H.1
Chiu, H.S.2
Chen, J.H.3
Chen, Y.C.4
-
11
-
-
62349112513
-
Absolute distance measurement by using modified dual-wavelength heterodyne Michelson interferometer
-
K. Chen, J. H. Chen, S. H. Lu, W. Y. Chang, and C. C. Wu, "Absolute distance measurement by using modified dual-wavelength heterodyne Michelson interferometer", Opt. Commun. 282(9), 1837-1840 (2009).
-
(2009)
Opt. Commun.
, vol.282
, Issue.9
, pp. 1837-1840
-
-
Chen, K.1
Chen, J.H.2
Lu, S.H.3
Chang, W.Y.4
Wu, C.C.5
-
12
-
-
0038679475
-
Two-dimensional rotation angle measurement using a sinusoidal phasemodulating laser diode interferometer
-
O. Sasaki, C. Togashi, and T. Suzuki, "Two-dimensional rotation angle measurement using a sinusoidal phasemodulating laser diode interferometer", Opt. Eng. 42(4), 1132-1136 (2003).
-
(2003)
Opt. Eng.
, vol.42
, Issue.4
, pp. 1132-1136
-
-
Sasaki, O.1
Togashi, C.2
Suzuki, T.3
-
13
-
-
84864290422
-
A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement
-
A. Kimura, W. Gao, W. Kim, K. Hosono, Y. Shimizu, L. Shi, and L. Zeng, "A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement", Precis. Eng. 36(4), 576-585 (2012).
-
(2012)
Precis. Eng.
, vol.36
, Issue.4
, pp. 576-585
-
-
Kimura, A.1
Gao, W.2
Kim, W.3
Hosono, K.4
Shimizu, Y.5
Shi, L.6
Zeng, L.7
-
14
-
-
33746782539
-
Measuring and compensating for 5-DOF parasitic motion errors in translation stages using Twyman-Green interferometry
-
J. S. Oh, E. D. Bae, T. Keem, and S. W. Kim, "Measuring and compensating for 5-DOF parasitic motion errors in translation stages using Twyman-Green interferometry", Int. J. Mach. Tools Manuf. 46(14), 1748-1752 (2006).
-
(2006)
Int. J. Mach. Tools Manuf.
, vol.46
, Issue.14
, pp. 1748-1752
-
-
Oh, J.S.1
Bae, E.D.2
Keem, T.3
Kim, S.W.4
-
15
-
-
84887498782
-
Development of a simple system for simultaneously measuring 6DOF geometric motion errors of a linear guide
-
F. Qibo, Z. Bin, C. Cunxing, K. Cuifang, Z. Yusheng, and Y. Fenglin, "Development of a simple system for simultaneously measuring 6DOF geometric motion errors of a linear guide", Opt. Express 21(22), 25805-25819 (2013).
-
(2013)
Opt. Express
, vol.21
, Issue.22
, pp. 25805-25819
-
-
Qibo, F.1
Bin, Z.2
Cunxing, C.3
Cuifang, K.4
Yusheng, Z.5
Fenglin, Y.6
-
16
-
-
25644433530
-
Straightness/coaxiality measurement system with transverse Zeeman dual-frequency laser
-
Q. Chen, D. Lin, J. Wu, J. Yan, and C. Yin, "Straightness/coaxiality measurement system with transverse Zeeman dual-frequency laser", Meas. Sci. Technol. 16(10), 2030-2037 (2005).
-
(2005)
Meas. Sci. Technol.
, vol.16
, Issue.10
, pp. 2030-2037
-
-
Chen, Q.1
Lin, D.2
Wu, J.3
Yan, J.4
Yin, C.5
-
17
-
-
70350129957
-
Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness
-
A. Kimura, W. Gao, Y. Arai, and Z. Lijiang, "Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness", Precis. Eng. 34(1), 145-155 (2010).
-
(2010)
Precis. Eng.
, vol.34
, Issue.1
, pp. 145-155
-
-
Kimura, A.1
Gao, W.2
Arai, Y.3
Lijiang, Z.4
-
18
-
-
79957633055
-
A three-axis autocollimator for detection of angular error motions of a precision stage
-
W. Gao, Y. Saito, H. Muto, Y. Arai, and Y. Shimizu, "A three-axis autocollimator for detection of angular error motions of a precision stage", Manuf. Technol. 60(1), 515-518 (2011).
-
(2011)
Manuf. Technol.
, vol.60
, Issue.1
, pp. 515-518
-
-
Gao, W.1
Saito, Y.2
Muto, H.3
Arai, Y.4
Shimizu, Y.5
-
19
-
-
84876690482
-
A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage
-
X. Li, W. Gao, H. Muto, Y. Shimizu, S. Ito, and S. Dian, "A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage", Precis. Eng. 37(3), 771-781 (2013).
-
(2013)
Precis. Eng.
, vol.37
, Issue.3
, pp. 771-781
-
-
Li, X.1
Gao, W.2
Muto, H.3
Shimizu, Y.4
Ito, S.5
Dian, S.6
-
20
-
-
79955839941
-
Two-dimensional displacement measurement by quasicommon-optical-path heterodyne grating interferometer
-
H. L. Hsieh, J. C. Chen, G. Lerondel, and J. Y. Lee, "Two-dimensional displacement measurement by quasicommon-optical-path heterodyne grating interferometer", Opt. Express 19(10), 9770-9782 (2011).
-
(2011)
Opt. Express
, vol.19
, Issue.10
, pp. 9770-9782
-
-
Hsieh, H.L.1
Chen, J.C.2
Lerondel, G.3
Lee, J.Y.4
-
21
-
-
4143096411
-
A heterodyne interferometer using an electro-optic modulator for measuring small displacements
-
D. C. Su, M. H. Chiu, and C. D. Chen, "A heterodyne interferometer using an electro-optic modulator for measuring small displacements", J. Opt. 27(1), 19-23 (1996).
-
(1996)
J. Opt.
, vol.27
, Issue.1
, pp. 19-23
-
-
Su, D.C.1
Chiu, M.H.2
Chen, C.D.3
|