Progresses in modeling HfOx RRAM operations and variability

ECS Transactions

Volumn 64, Issue 14, 2014, Pages 49-60

  Larcher, L ^a,b   Pirrotta, O ^a   Puglisi, F M ^a   Padovani, A ^a,b   Pavan, P ^a   Vandelli, L ^a,b  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b MDLab ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

HAFNIUM OXIDES;

DEVICE OPERATIONS; DEVICE PERFORMANCE; ELECTRICAL DEVICES; FABRICATION PROCESS; MODELING ENVIRONMENTS; MODELING METHODOLOGY; MULTI-SCALE APPROACHES; STATE OF THE ART;

RANDOM ACCESS STORAGE;

EID: 84921283434     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/06414.0049ecst     Document Type: Conference Paper

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