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Volumn 54, Issue 1, 2015, Pages 011602-

Correlation between ambient air and continuous bending stress for the electrical reliability of flexible pentacene-based thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; FIELD EFFECT TRANSISTORS; MOISTURE; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM CIRCUITS; THIN FILMS;

EID: 84920639614     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.7567/JJAP.54.011602     Document Type: Article
Times cited : (7)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.