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Volumn 259, Issue PA, 2014, Pages 98-101

Plasma-enhanced atomic layer deposition (PEALD) of cobalt thin films for copper direct electroplating

Author keywords

Atomic layer deposition; CCTBA; Cobalt; Copper interconnect; Direct plating

Indexed keywords

ATOMIC LAYER DEPOSITION; ATOMS; COBALT; COPPER; INTEGRATED CIRCUIT INTERCONNECTS; METALLIC FILMS; PLATING; SILICA; TANTALUM COMPOUNDS; THIN FILMS;

EID: 84920044969     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2014.05.005     Document Type: Article
Times cited : (22)

References (20)
  • 1
    • 84920012134 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (Edition 2009, Interconnect, 2009).
    • International Technology Roadmap for Semiconductors (Edition 2009, Interconnect, 2009).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.