Distinguishing mechanisms of morphological instabilities in phase change materials during switching

Thin Solid Films

Volumn 571, Issue P1, 2014, Pages 39-44

  Santala, M K ^a   Raoux, S ^b   Topuria, T ^c   Reed, B W ^a   Lagrange, T ^a   Campbell, G H ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

Dynamic transmission electron microscopy; In situ transmission electron microscopy; Phase change materials; Thin film instabilities

Indexed keywords

GERMANIUM COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN SITU PROCESSING; PHASE CHANGE MEMORY; THIN FILMS; TRANSMISSIONS;

DYNAMIC TRANSMISSION ELECTRON MICROSCOPIES; EXPERIMENTAL METHODS; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; MORPHOLOGICAL CHANGES; MORPHOLOGICAL INSTABILITY; SOLID SUBSTRATES; THIN FILM INSTABILITIES; TIME RESOLVED IMAGING;

PHASE CHANGE MATERIALS;

EID: 84919698459     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.09.063     Document Type: Article

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