Evolution of a stress-driven pattern in thin bilayer films: Spinodal wrinkling

Physical Review Letters

Volumn 91, Issue 15, 2003, Pages

  Yoo, Pil J ^a   Lee, Hong H ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FAST FOURIER TRANSFORMS; POLYSTYRENES; STRESSES; SURFACE TOPOGRAPHY; THERMAL EXPANSION; VISCOELASTICITY;

SPINODAL WRINKLING;

THIN FILMS;

EID: 4344646517     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.154502     Document Type: Article

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