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Volumn 2, Issue 2, 2014, Pages

Single-Shot MeV Transmission Electron Microscopy with Picosecond Temporal Resolution

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SOURCES; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84919690072     PISSN: None     EISSN: 23317019     Source Type: Journal    
DOI: 10.1103/PhysRevApplied.2.024003     Document Type: Article
Times cited : (110)

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    • The polynomial fitting of (Equation presented) uses even-order components (due to middle-plane symmetry) up to tenth order and precisely represents the smooth distribution. For example, when (Equation presented) macroparticles are used in simulation, the difference of (Equation presented) between direct counting of macroparticles and polynomial fitting is (Equation presented), on the same magnitude of the macroparticle shot noise
    • The polynomial fitting of (Equation presented) uses even-order components (due to middle-plane symmetry) up to tenth order and precisely represents the smooth distribution. For example, when (Equation presented) macroparticles are used in simulation, the difference of (Equation presented) between direct counting of macroparticles and polynomial fitting is (Equation presented), on the same magnitude of the macroparticle shot noise.
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