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Review of Scientific Instruments

Volumn 80, Issue 8, 2009, Pages

Experimental demonstration of high quality MeV ultrafast electron diffraction

(8) Li, Renkai a Tang, Chuanxiang a Du, Yingchao a Huang, Wenhui a Du, Qiang a Shi, Jiaru a Yan, Lixin a Wang, Xijie b

a TSINGHUA UNIVERSITY (China)

b BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; DEBYE-SCHERRER RINGS; ELECTRON PULSE; HIGH QUALITY; MEGA-ELECTRON-VOLT; PHOTOCATHODE RF GUN; POLYCRYSTALLINE ALUMINUM; SIMULATION OPTIMIZATION; SPATIAL RESOLUTION; TEMPORAL RESOLUTION; ULTRA-FAST; ULTRAFAST ELECTRON DIFFRACTION;

ALUMINA; ALUMINUM FOIL; ELECTRON DIFFRACTION; ELECTRON GUNS; IMAGE RESOLUTION; STRUCTURAL DYNAMICS;

ELECTRONS;

ALUMINUM DERIVATIVE;

ARTICLE; CHEMISTRY; COMPUTER SIMULATION; ELECTRON; INSTRUMENTATION; KINETICS; LASER; RADIATION SCATTERING; TIME; ULTRAVIOLET RADIATION; X RAY DIFFRACTION;

ALUMINUM COMPOUNDS; COMPUTER SIMULATION; ELECTRONS; KINETICS; LASERS; SCATTERING, RADIATION; TIME FACTORS; ULTRAVIOLET RAYS; X-RAY DIFFRACTION;

EID: 69749101311 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3194047 Document Type: Article

Times cited : (102)

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