Imaging single electrons to enable the generation of ultrashort beams for single-shot femtosecond relativistic electron diffraction

Journal of Applied Physics

Volumn 110, Issue 7, 2011, Pages

  Li, R K ^a   Musumeci, P ^a   Bender, H A ^b   Wilcox, N S ^b   Wu, M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NATIONAL SECURITY TECHNOLOGIES LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING STRUCTURE; BUNCH LENGTH; CAMERA NOISE; CHARGE-COUPLED DEVICE CAMERA; CRYSTALLINE SAMPLES; DETECTION EFFICIENCY; DETECTION SYSTEM; ELECTRON PHONON COUPLINGS; FEMTOSECONDS; HIGH GRADIENT; HIGH QUALITY; MEV-ELECTRONS; NONEQUILIBRIUM PHONONS; PEGASUS; PHOSPHOR SCREENS; PHYSICAL PROCESS; QUANTITATIVE STUDY; RELATIVISTIC ELECTRON; RELATIVISTIC ELECTRON BEAM; SINGLE ELECTRON; SINGLE-SHOT; STRUCTURAL CHANGE; ULTRA-FAST; ULTRAFAST ELECTRON DIFFRACTION; VELOCITY BUNCHING;

CAMERAS; ELECTRON BEAMS; ELECTRON DIFFRACTION; PHONONS;

ELECTRONS;

EID: 80054978368     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3646465     Document Type: Article

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