XPS evidence for negative ion formation in SIMS depth profiling of organic material with cesium

Journal of Physical Chemistry C

Volumn 118, Issue 46, 2014, Pages 26613-26620

  Wehbe, Nimer ^a   Pireaux, Jean Jacques ^a   Houssiau, Laurent ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AMINO ACIDS; AMMONIA; CESIUM; CHARGE TRANSFER; DEPTH PROFILING; MOLECULES; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBOXYLIC GROUP; CHARGE TRANSFER MECHANISMS; CHEMICAL FUNCTIONALITY; ELECTRON TRANSFER; ORGANIC MATERIALS; ORGANIC MOLECULES; SURFACE CONCENTRATION; ZWITTERIONIC FORMS;

NEGATIVE IONS;

EID: 84914695530     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp501851f     Document Type: Article

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