Monitoring Si growth on Ag(111) with scanning tunneling microscopy reveals that silicene structure involves silver atoms

Applied Physics Letters

Volumn 105, Issue 21, 2014, Pages

  Prevot G ^a   Bernard, R ^a   Cruguel, H ^a   Borensztein, Y ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON ALLOYS; SILVER; SILVER ALLOYS;

AG SUBSTRATE; COVERED AREAS; REAL TIME; SILICENE; STEP EDGE; STRONG INTERACTION; SURFACE ALLOYS; SURFACE LAYERS;

CRYSTAL ATOMIC STRUCTURE;

EID: 84912075786     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4902811     Document Type: Article

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