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Volumn 89, Issue 24, 2014, Pages

Structure determination of multilayer silicene grown on Ag(111) films by electron diffraction: Evidence for Ag segregation at the surface

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EID: 84902815984     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.241403     Document Type: Article
Times cited : (78)

References (38)
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    • See Supplemental Material at for the analysis of the LEED (Equation presented) curves for the Si(111)(Equation presented)-Ag surface.
    • See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.241403 for the analysis of the LEED (Equation presented) curves for the Si(111)(Equation presented)-Ag surface.
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