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Surface Science

Volumn 623, Issue , 2014, Pages 25-28

Determination of atomic positions in silicene on Ag(111) by low-energy electron diffraction

(7) Kawahara, K a Shirasawa, T a Arafune, R b Lin, C L a Takahashi, T a Kawai, M a Takagi, N a

a UNIVERSITY OF TOKYO (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Low energy electron diffraction; Silicene; Surface thin layer

Indexed keywords

EID: 84894197572 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2013.12.013 Document Type: Article

Times cited : (95)

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