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Volumn 8, Issue 7, 2014, Pages 7538-7547

Silicon growth at the two-dimensional limit on Ag(111)

Author keywords

molecular beam epitaxy; scanning tunneling microscopy; silicene; surface reconstruction; two dimensional materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ELECTRONIC PROPERTIES; HONEYCOMB STRUCTURES; MICROELECTRONICS; MOLECULAR BEAM EPITAXY; NANOSHEETS; PRECIPITATION (CHEMICAL); SCANNING TUNNELING MICROSCOPY; SILICON; SILVER; SURFACE RECONSTRUCTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84904740794     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn503000w     Document Type: Article
Times cited : (99)

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